Make and Model:
NanoSurf FlexAFM; EasyScan2
Description:
Measurement provides topographic (height) information or size (height/thickness) distribution in solid samples (soft/hard materials) under ambient conditions.
Features:
AFM Single scan head for height or topographic profile down to ~1 nm (Z) and ~25 nm (XY) Maximum scan range XYZ up to 10 x 10 x 3 μm
CCD Camera for tip surface distance adjustment
Automatic Laser alignment for tip-approach
Data acquisition and analysis software
Available mode of use:
- Contact and tapping (dynamic) mode
- Possible to perform Phase contrast Imaging,
- Force Modulation microscopy,
- Magnetic Force Microscopy (user need to buy tips),
- Force spectroscopy
- Measurements at ambient conditions; require special cell(petridish) for solution
Location:
Room 204, 1st Floor, Chemistry Building
Contact details:
022-25764155 (AC group)
Faculty Incharge:
Prof. Arindam Chowdhury (arindam@chem.iitb.ac.in)