Make and Model:
Zeiss Sigma 500
Description:
The Zeiss Sigma 500 Scanning Electron Microscope (SEM) is a high-performance technique designed for advanced imaging and analytical applications. It features a field emission gun (FEG) for high-resolution imaging, capable of achieving nanometer-scale detail. The Sigma 500 offers a user-friendly interface, fast image acquisition, and superior signal-to-noise ratio. Without the Electron Backscatter Diffraction (EBSD) detector, the instrument focuses on secondary and backscattered electron imaging, along with energy-dispersive X-ray spectroscopy (EDS) for elemental analysis, making it ideal for material characterization and failure analysis. Its modular design allows future upgrades for additional analytical capabilities.
Features:
Features/ Accessories:
1. Equipped with a Field Emission Gun (FEG) for nanometer-scale imaging.Achieves high resolution for both secondary electron (SE) and backscattered electron (BSE) imaging.
2. Optimized electron optics for high-contrast imaging.
3. Enables elemental analysis and mapping (when paired with an EDS detector).
Available mode of use:
Available detectors of Use:
1. Inlens detectror : High resolution imaging to enhance surface topography and material contrast.
2. Secondary Electron (SE) Detector:Ideal for topographical imaging with high surface sensitivity.
3. Backscattered Electron (BSE) Detector:Provides compositional contrast based on atomic number differences.
Location:
Lab No 009 Ground floor New CESE-DESE building
Contact details:
20002994@iitb.ac.in
Faculty Incharge:
Prof. Kamendra Sharma (k.sharma@iitb.ac.in)
