Make and Model: 
NanoSurf FlexAFM; EasyScan2
Measurement provides topographic (height) information or size (height/thickness) distribution in solid samples (soft/hard materials) under ambient conditions.
AFM Single scan head for height or topographic profile down to ~1 nm (Z) and ~25 nm (XY) Maximum scan range XYZ up to 10 x 10 x 3 μm CCD Camera for tip surface distance adjustment Automatic Laser alignment for tip-approach Data acquisition and analysis software
Available mode of use: 
  • Contact and tapping (dynamic) mode
  • Possible to perform Phase contrast Imaging,
  • Force Modulation microscopy,
  • Magnetic Force Microscopy (user need to buy tips),
  • Force spectroscopy
  • Measurements at ambient conditions; require special cell(petridish) for solution

Room 204, 1st Floor, Chemistry Building

Contact details: 
022-25764155 (AC group)
Faculty Incharge: 

Prof. Arindam Chowdhury (