Speaker: Dr. Alpesh Khushalchand Shukla
ZoNexus LLC
Title: “Electron microscopy of battery materials:
crystallographic ambiguities and experimental
challenges”.
Day and Date: Wednesday, February 07, 2024
Time: 17.00 Hrs.
Venue: Room no. 350, Chemistry Department
Second floor, Annex
------------------------------------------------------------------------
Hosted by Prof. Srinivasan Ramakrishnan
Abstract Macroscopic degradation of cathode materials in lithium-ion batteries often
begin with microscopic changes and it is important to study pristine and
cycled materials at the atomic level. Electron microscopy is widely used to
characterize battery materials owing to the high spatial resolution it
provides using a variety of imaging, diffraction and spectroscopy
techniques. However, researchers are often faced with ambiguities in
structural determination of these materials due to similarities between
various phases present in battery materials and oversimplifications in
interpreting the data. Furthermore, there are experimental challenges due
to the electron beam-sensitive and air-sensitive nature of many battery
materials. In this talk, I will discuss two examples to demonstrate
challenges in structure determination. For lithium- and manganese-rich
lithium transition metal oxides, I will demonstrate how atomic resolution,
HAADF STEM imaging using multiple zone axes was critical in solving the
structure while diffraction provided ambiguous results. For
electrochemically cycled nickel-rich lithium transition metal oxides, I
will show how electron diffraction, including 4D STEM nanodiffraction
mapping helped in correctly identifying the transformed phase as compared
to atomic resolution imaging that exhibited higher amount of ambiguity.
Finally, I will discuss development of tools such as an air-free transfer
in situ TEM holder, an air-free transfer module for FIB/SEM, a cryo-biasing
holder and a continuous rotation tomography holder that were designed
specifically to address experimental challenges in electron microscopy of
air-sensitive and electron beam-sensitive materials.