CH 820

Structure Analysis by Diffraction Methods
Syllabus: 

Review of the principles and applications of the following for structure analysis: Electron microscopy, electron diffraction, X-ray diffraction and neutron diffraction. Advanced methods of X-ray data collection and solving the phase problem. Patterson function, image seeking functions and their use in structure analysis.

Refinement of crystal structures. Low energy electron diffraction technique of structure analysis. Fluid diffraction patterns and structure dynamics. Methods of neutron diffraction: data collection, structure analysis and refinement. Use of polarised neutron beams in structure analysis. Diffraction at small angles/interpretation of larger structures. Working examples of Structure Determination of self-assembled structures, polymers etc by diffraction.

Text References: 

1. M. J. Buerger, Contemporary Crystallography, McGraw Hill, l970.

2. G. H. Stout and L. H. Jenson, X-ray Structure, Mcmillan, l968.

3. L. A. Feigin and D. I. Svergun, Structure Analysis by Small Angle X-ray and Neutron Scattering, Springer, 2013.

4. N. Kasai and M. kakudo, X-Ray Diffraction by Macromolecules, Springer, 2006.